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Scanning Electron Microscope (SEM) - JEOL JSM 6500F

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Contact details

Kwakernaak, C. Ing.
Mechanical, Maritime and Materials Engineering (3mE), Materials Science and Engineering
Mekelweg 2, 2628 CD Delft
Tel : +31 (0)15 27 82223
E-mail : C.Kwakernaak@tudelft.nl
Website : Open website

General Information


Scanning Electron Microscope (SEM) - JEOL JSM 6500F


Department of Materials Science and Engineering, Room 3B-1-06, Mekelweg 2, Delft (building #34)

Key words:

SEM, EBSD, particle analysis, in-situ tensile testing

Main application:

Apart from visual inspection, the SEM offers a wide variety of analysis techniques as EDS for chemical analysis, EBSD for crystallographic identification and OIM (orientation imaging microscopy), particle size analysis and the in-situ study of crack formation in tensile loaded specimen

Instrument specification

Acceleration voltages from 1 to 25 kV and currents up to 20 nA.

This instrument is intended for scientific research and is not to be used for routine analysis. Also, samples that bear a risk of contaminating the system will not be analyzed. Prior to analysis each request is assessed.

Further contact:

Dr.ir. W.G. Sloof
section Surfaces & Interfaces
Department of Materials Science and Engineering, 3ME
Mekelweg 2
2628 CD Delft
tel +31 (0)15 27 84924