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Electron Probe Micro-Analysis - JEOL JXA 8900R

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Contact details

Kwakernaak, C. Ing.
Mechanical, Maritime and Materials Engineering (3mE), Materials Science and Engineering
Mekelweg 2, 2628 CD Delft
Tel : +31 (0)15 27 82223
E-mail : C.Kwakernaak@tudelft.nl
Website : Open website

General Information


Electron Probe Micro-Analysis - JEOL JXA 8900R


Department of Materials Science and Engineering, Room 3B-1-06, Mekelweg 2, Delft (building #34)

Key words:

X-ray mapping., spectroscopic studies, Quantitative analysis

Main application:

Apart from visual inspection, the EPMA offers a analysis techniques as EDS for chemical analysis, WDS for accurate compositional determinations. The extensive WDS system is especially suited multicomponent analysis and ideally equipped for the quantitation of light elements.

Instrument specification

Acceleration voltages from 5 to 30 kV and currents up to 2000 nA.

This instrument is intended for scientific research and is not to be used for routine analysis. Also, samples that bear a risk of contaminating the system will not be analyzed. Prior to analysis each request is assessed.

Further contact:

Dr.ir. W.G. Sloof
section Surfaces & Interfaces
Department of Materials Science and Engineering, 3ME
Mekelweg 2
2628 CD Delft
tel +31 (0)15 27 84924