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X-ray Photoelectron Spectroscopy (XPS) and Electron Spectroscopy for Chemical Analysis (ESCA)

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Contact details

Kwakernaak, C. Ing.
Mechanical, Maritime and Materials Engineering (3mE), Materials Science and Engineering
Mekelweg 2, 2628 CD Delft
Tel : +31 (0)15 27 82223
E-mail : C.Kwakernaak@tudelft.nl
Website : Open website

General Information

Instrument:

X-ray Photoelectron Spectroscopy (XPS) and Electron Spectroscopy for Chemical Analysis (ESCA)

Location:

Department of Materials Science and Engineering, Room 3B-1-06, Mekelweg 2, Delft (building #34)

Key words:

XPS, ESCA

Main application:

This analysis technique detects photoelectrons generated by ncident x-rays due to the well-known photoelectric effect. Photoelectrons are ideally suited to examine the chemical state of the specimen surface, due to the low escape depth of a few nanometers of photoelectrons. The analytical possibilities are extended using angular resolved spectroscopy, a technique that gives information about the structure of the surface few nanometers.

Instrument specification

Energy resolution ΔE = 0.05 eV or better. The excitation sources are unmonochromatized Mg-Kα and Al-Kα radiation.

Note:
This instrument is intended for scientific research and is not to be used for routine analysis. Also, samples that bear a risk of contaminating the system will not be analyzed. Prior to analysis each request is assessed.

Further contact:

Dr.ir. W.G. Sloof
section Surfaces & Interfaces
Department of Materials Science and Engineering, 3ME
Mekelweg 2 
2628 CD Delft
tel +31 (0)15 27 84924
E-mail:w.g.sloof@tnw.tudelft.nl