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Surface layer examination instrument

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Contact details

Van Meer, Serge
Aerospace Engineering (LR), Delft Aerospace Structures & Materials Laboratory
Kluyverweg 3, 2629HS Delft
Tel : +31 (0)15 27 85136
E-mail : S.C.H.vanMeer@tudelft.nl
Website : Open website

General Information


Surface layer examination instrument


Delft Aerospace Structures & Materials Laboratory, Kluyverweg 1, Delft (building #41)

Key words:

contact angle, polarity of surface, quality control for wafers and microelectronics, testing coating quality, Surface treatment assessment

Main application:

The Contact Angle Measuring System G2 allows the fully automatic measurement of contact angle, surface tension of solids, surface tension and interfacial tension of liquids. The G2 is the analysis system for routine quality control. From test liquid dosing and precise positioning of samples to analysing measured data - the entire measuring cycle is fully automatic.

Instrument specification


G2 system

Measuring method:
Pendant drop method and sessile drop method. The machine is equiped with a multiple liquid dosing unit, which allows selection up to six test liquids without changing or reloading syringes.