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Microscope PC-controlled on xyz-table

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microscope_pccontrolled.jpg

General Information

Instrument:

Microscope PC-controlled on xyz-table

Location:

Delft Aerospace Structures & Materials Laboratory, Kluyverweg 1, Delft (building #41)

Key words:

camera, defects, magnification, microcrack, measurement, surface, crack

Main application:

Detection of surface defects (microcracks) and adjacent to holes (electromagnetic)

Instrument specification

Microscope PC-controlled on xyz-table with crack measuring system

Brand:
Uhl system & camera Ais-MX5

Magnification:
150 x

Image size:
512x512 pixels

Color:
8-bit grey scale