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X-ray diffractometer 1

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bruker_d8_discover.jpg

Contact details

Norder, Ben
Applied Sciences (TNW), DelftChemTech, Polymer Materials and Engineering
Julianalaan 136, 2628 BL Delft
Tel : +31 (0)15 27 84262
E-mail : B.Norder@TUDelft.NL
Website : Not available

General Information

Instrument:

X-ray diffractometer 1

Location:

Faculty of Applied Sciences, Julianalaan 136, 2628 BL Delft

Key words:

X-Ray, diffraction, powder, diffractometer, phase, identification;, stress, analysis, crystallographic, texture, orientation, strain, analysis, crystallite, determination

Measured quantity:

In X-ray diffraction, a powdered sample of a crystalline material (or in more elaborate methods a single crystal) is irradiated with X-rays of a known wavelength. As a result of the lattice of the crystal(s), different lattice planes will diffract the x-rays. The diffracted X-rays are detected as a function of their diffraction angle, which is related to the position of the lattice planes in the crystal. This results in a pattern of peaks versus diffraction angle (diffraction pattern), in which positions and intensities are typical for (a) crystalline compound. Identification of the crystalline compound(s) takes place using an extensive database of diffraction patterns, or by full profile fitting procedures like the Rietveld-method.

Main application:

X-Ray diffraction analysis is a non-destructive method to determine in crystalline materials (i) the phase composition (ii) the distribution of the orientations of the crystallites and (iii) the (residual) stresses.

Instrument specification

Brand:
Bruker

Type:
D8 Discover

Specifications:

  • Vertical q-q diffractometer, parallell-beam geometry
  • ¼ centric eulerian cradle
  • High-temperature chamber for powders and films (Anton Paar 1200) up to 1200°C in diverse atmospheres and vacuum (10-4 mbar)
  • Cu-radiation with line focus or Cr-radiation with point focus
  • Göbel mirror for Cu-radiation
  • 2-bounce Ge(022) monochromator (Cu-Ka1, divergence ~0.006°)
  • Polycapillar for Cr-radiation
  • Automatic absorbercarrousel
  • Beam knife for reflectometry applications
  • Fixed slits of 0.12° thin film attachment for the secondary side
  • Secundary LiF monochromator (if fluorescense or Kb suppression)
  • NaI(Tl) scintillation detector
  • Measurement in reflection
  • Measurement in transmission for powders with a capillar samplestage (Debye-Scherrer geometry)