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Dielectric spectrometer 4

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Contact details

Giacomelli Penon, M.
Applied Sciences (TNW), DCT/Nano Struc. Materials
Julianalaan 136, 2628BL Delft
Tel : +31 (0)15 27 84603
E-mail : M.GiacomelliPenon@tudelft.nl
Website : Open website

General Information

Instrument:

Dielectric spectrometer 4

Description

A technique for measuring the dielectric properties of materials as a function of the frequency.

Location:

Room k.314, Faculty of Applied Sciences, Julianalaan 136, 2628 BL Delft

Key words:

impedance spectroscopy, spectrometry, spectrometer, broadband, conductivity, dielectric properties

Main application:

Measuring the dielectric properties of materials as a function of the frequency. The measurements yield information about conductivity and the dielectric constant. These properties depend upon polymer mobility and relaxations, and hence probe the relaxational dynamics in soft matter. The technique is based on the interaction of an external field with the (local) electric dipole moments in the sample. The fluctuations of the local electric fields are measured and provide insight on the dynamics on a molecular scale. This specific setup uses a contstant frequency.

Instrument specification

Brand:
Andeen Hagerling

Type:
2500 A

1 kHz Automatic Capacitance Bridge