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Scanning Electron Microscope (SEM) JSM 6300

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jeol_jsm_6300.jpg

Contact details

van Driel, Jos
Mechanical, Maritime and Materials Engineering (3mE), Precision and Microsystems Engineering
Mekelweg 2, 2628 CD Delft
Tel : +31 (0)15 27 86838
E-mail : J.A.S.vanDriel@tudelft.nl
Website : Not available

General Information

Instrument:

Scanning Electron Microscope (SEM) JSM 6300

Description

JEOL JSM-6300 scanning electron microscope (SEM) allows high resolution photography of samples.

Location:

Department of Precision and Microsystems Engineering, Clean Room Hal 5A, Mekelweg 2, Delft (building #34)

Key words:

in-situ tensile testing, particle analysis, EBSD, SEM

Main application:

Apart from visual inspection, the SEM offers a wide variety of analysis techniques as EDS for chemical analysis, EBSD for crystallographic identification and OIM (orientation imaging microscopy), particle size analysis and the in-situ study of crack formation in tensile loaded specimen

Instrument specification

Brand:
JEOL

Type:
JSM 6300

Jeol JSM-6300 is a modern analytical SEM fitted with conventional tungsten filament. It operates at accelerating voltages of between 0.2 and 30 kV in secondary and backscattered modes.