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Microscope Leica DMLM

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leica_dmlm.jpg

Contact details

Van Asperen, Sander
Mechanical, Maritime and Materials Engineering (3mE), MSE
Mekelweg 2, 2628CD Delft
Tel : 015 2782189
E-mail : s.vanasperen-1@tudelft.nl
Website : Not available

General Information

Instrument:

Microscope Leica DMLM

Location:

Microstructural Control in Metals, Department of Materials Science and Engineering, Room 3B-0-42, Mekelweg 2, Delft (building #34)

Key words:

fluorescence, quantitative interference, differential interference contrast, polarisation contrast, darkfield, brightfield, polarisation, nomarski

Main application:

The Leica DMLM is a microscope with a modular design that makes it suitable for a wide range of applications.

Instrument specification

Brand:
Leica DMLM (3x)
Olympus BX60M (1x)

Max. magnification:
1000 x

Incident light techniques:


Brightfield
Darkfield
Polarisation contrast
Differential interference contrast
Quantitative interference
Fluorescence

Transmitted light techniques:

Brightfield
Darkfield
Phase contrast
Oblique illumination
Polarisation
Interference contrast

The microscope is attached to a digital camera and hard disk. Image editing software is availible.