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Woollam M2000 Ellipsometer

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Woollam M2000 Ellipsometer

Contact details

Visser, Cassan Drs.
Electrical Engineering, Mathematics and Computer Science (EWI), DIMES
Feldmannweg 17, 2628 CT Delft
Tel : +31 (0)15 27 81787
E-mail : c.c.g.visser@tudelft.nl
Website : Open website

General Information

Instrument:

Woollam M2000 Ellipsometer

Location:

Dimes Class 100

Key words:

layer thickness, Optical constants

Measured quantity:

N, K, thickness

Main application:

Optical Characterisation of thin layers (dielectric, metals)

Instrument specification

Wavelength range: 250nm-1700nm