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Atomic Force Microscope (AFM)

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Atomic Force Microscope.png

Contact details

Dingemans, Theo Dr.
Aerospace Engineering (LR), Fundamentals of Advanced Materials (FAM)
Kluyverweg 1, 2629 HB Delft
Tel : +31 (0)15 27 84520
E-mail : t.j.dingemans@tudelft.nl
Website : Open website

General Information

Instrument:

Atomic Force Microscope (AFM)

Location:

Experimental hall, FAM lab, Faculty of Aerospace Engineering, Kluyverweg 1, Delft (buidling #41))

Key words:

liquids, solids, contact, non-contact, advanced surface characterization

Main application:

Surface characterization at the atomic scale and at the micrometer scale of solid and liquid thin films.

Instrument specification

Magnification:
up to 1x109 x

Force sensitivity:
approx. 0.1 nN (lower limit of detection)

Imaging modes:
non-contact, contact, intermittent-contact, in liquids and solids

Oscillation (in intermittent-contact mode):
50-500 kHz

Amplitude of oscilation (in intermittent-contact mode):
10-100 nm

Scanner:
8 um x 8 um (installation of a 100 um x 100 um scanner is possible)

Image processing capabilities:
image processing software is available

Image size:
1) 200 x 200 pixels
2) 500 x 500 pixels
3) 1000 x 1000 pixels