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Environmental Scanning Electron Microscope (ESEM)

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ESEM.png

Contact details

Thijssen, Arjan
Civil Engineering and Geosciences (CiTG), M&E
Stevinweg 1, 2628CN Delft
Tel : 015 2784973
E-mail : A.Thijssen@tudelft.nl
Website : Not available

General Information

Instrument:

Environmental Scanning Electron Microscope (ESEM)

Location:

Microlab, Faculty of Civil Engineering and Geosciences, Stevinweg 1, Delft (building #23)

Key words:

Electron Microscopy, Low vacuum, dynamic relative humidity, microstructure, EDX, BSE, GSE, SEM

Main application:

Electron microscope for studying material microstructure at high magnification under various conditions. Can examine <b>non-conductive</b> specimen

Instrument specification

Philips XL30 ESEM
Tungsten filament electron microscope
Detectors:
SE, GSE, BSE detectors

Magnification:
100x – 50,000x

Relative Humidity range:
0-100%

Temperature range:
–30 °C to + 30 °C

EDX:
EDX system by EDAX (EDAM 3 EDS system)
EDX window: SUTW 3.3
EDX resolution: 128.0 eV

Cooling stage for samples of 30 x 30 mm for RH control between 0 – 100% (home made)
Small mechanical loading device fitted for ESEM chamber
Kammrath & Weiss
5 kN tension/compression