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Transmission Electron Microscope Philips CM30T

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CM30T klein.png

Contact details

Kooyman, P.J. Dr.
Applied Sciences (TNW), National Centre for HREM (Kavli Institute of Nanoscience Delft)
Lorentzweg 1, 2628 CJ Delft
Tel : +31 (0)15 27 82251
E-mail : P.J.Kooyman@TUDelft.nl
Website : Open website

General Information

Instrument:

Transmission Electron Microscope Philips CM30T

Location:

Physics building (# 22), Lorentzweg 1, 2628 AL, Delft

Key words:

STEM, EDS, Transmission Electron Microscopy

Main application:

Materials nano structure analysis: composition, microstructure determination.

Instrument specification

Main specifications
 CM30T
(1989)
CM300UT-FEG
(1997)
Monochromated
Tecnai
 (2002)
Maximal voltage300300200
Point resolution
(nm)
0.230.170.19
Tilt possibilities±45˚±28˚±28˚
Information limit 
(nm)
0.200.100.10
EDS, detection of elements>boronboronboron
Probe size for EDS1.50.70.2
STEM probe size
(nm)
1.0-0.20
EELS resolution--50 meV**
Energy filtered
 imaging
--yes
Probe size for
 EELS (nm)
--0.2 nm**
Slow scan
CCD camera
-1024x10244096x4096
Video cameraGatan analogGatan off-axis CCD024x1024 CCD on GIF
The most important properties of the transmission electron microscopes. EDS=Energy Dispersive Spectroscopy; PEELS= Parallel Electron Energy Loss Spectroscopy. ** 0.2 nm at 200 meV, 2 nm at 50 meV.

Other contact:
Dr. S. Lazar
Applied Physics
B 213
Lorentzweg 1
2628 CJ Delft
Tel: +31 (0)15 27 82252
E-mail: S.Lazar@TNW.TUDelft.nl